
 Generate File TITLE:   .
 Crystal Identifier:    ref-AV01-3342167Aa_1



 *** WARNING *** No attempt will be made to measure overloaded reflections
 Use keywords PROFILE OVERLOAD to estimate overloads by profile fitting
 IMAGE  CCX   CCY  CCOM  DIST  YSCALE TILT TWIST ROFF  TOFF RESID WRESID FULL PART OVRL  NEG BAD  I/SIGI   I/SIGI Rsym Nsym SDRAT
                                                                                               overall (at 1.5A)
 $TABLE: Refined detector parameters:
 $GRAPHS :Camera constants CCX CCY (mm) CCOM (deg) v image:A:1,2,3,4:  
 :Distance (mm) v image:A:1,5:
 :Yscale v image:A:1,6:
 :Tilt and twist (hundredths of deg) v image:A:1,7,8:
 :ROFF and TOFF (mm) v image:A:1,9,10:
 :Positional error (mm) and weighted error v image:A:1,11,12:
 :I/sig(I) overall and outer v image:N:1,18,19:
 :Rsym v image:N:1,20:  
 :SDratio v image:N:1,22:  
 :Number of overloads and badspots v image:A:1,15,17: $$
 IMAGE   CCX   CCY   CCOM  DIST YSCAL TILT TWIST ROFF  TOFF RESID  WRESID  FULL  PART OVRL  NEG BAD I/sigI I/sgI_out Rsym Nsym SDRAT $$ $$
 $$
  $TABLE: Post refinement:
 $GRAPHS :Missets phix phiy phiz v image:A:1,2,3,4:  
 :Cell parameters A,B,C v image:A:1,5,6,7:  
 :Cell angles alpha beta gamma v image:A:1,8,9,10:  
 :Mosaic spread v image:A:1,11:  
 :Beam divergences v image:A:1,12,13: $$  
 Image     PHIX     PHIY     PHIZ        A        B        C      ALPHA     BETA    GAMMA   MOSAIC   DIVH   DIVV    Resid      NR $$ $$
 $$
