
 Generate File TITLE:   .
 Crystal Identifier:    ref-srpol-HA00AG3240_1



 *** WARNING *** No attempt will be made to measure overloaded reflections
 Use keywords PROFILE OVERLOAD to estimate overloads by profile fitting
 IMAGE  CCX   CCY  CCOM  DIST  YSCALE TILT TWIST ROFF  TOFF RESID WRESID FULL PART OVRL  NEG BAD  I/SIGI   I/SIGI Rsym Nsym SDRAT
                                                                                               overall (at 1.5A)


 *** For information only. ***

 PARTIALS INCLUDED IN POSITIONAL REFINEMENT AND PROFILES
 =======================================================
 Because there were rather few fully recorded reflections in the central region
 of the first image, partials have been included both in the positional
 refinement and in profile formation.
 (The minimum number (eg 20) is set by keywords: REFINEMENT NREF 20 )
 This is equivalent to including keywords:
 REFINEMENT INCLUDE PARTIALS 0.50
 PROFILE PARTIALS


 *** Warning messages ***

 AVERAGING OF STANDARD PROFILES
 ==============================
 Profile averaging has been performed for some of the standard profiles.
 If possible this should be avoided, eg by accumulating the profiles
 over more images (BLOCK parameter on PROCESS keyword).
 Do not attempt to process spots that are not really there !
 If profiles are being averaged because the RMSBG is too high, but 
 this is because of diffuse scatter, it is best to increase the maximum 
 allowed RMSBG (default value 20.0): PROFILE RMSBG 25 (for example).


 POOR PROFILES IN SOME AREAS
 ===========================
 For  8 profiles the correlation coefficient with the central profile is less than 0.5.
 Smallest correlation coefficient is-0.51
 Possible reasons are:
 1) Very weak diffraction (consider cutting back the resolution)
 2) Errors in cell parameters (check DELX, DELY for the standard profiles).
 3) Genuine variation due to high obliquity (for example).
 4) Presence of zingers or spots from an ice or salt crystal which are much
 stronger than the protein spots. Sometimes these can be rejected using
 the PROFILE CUTOFF keywords.

 A low correlation does NOT necessarily mean that the processing needs to be changed.

 The image number, profile box number and correlation coefficient for
 up to the first 6 occurences are:
   ID BOX CORRLN     ID BOX CORRLN     ID BOX CORRLN     ID BOX CORRLN   
    1   2  -0.05      1   4  -0.51      1   6   0.31      1  10   0.09
    1  14  -0.04      1  15   0.37
 $TABLE: Refined detector parameters:
 $GRAPHS :Camera constants CCX CCY (mm) CCOM (deg) v image:A:1,2,3,4:  
 :Distance (mm) v image:A:1,5:
 :Yscale v image:A:1,6:
 :Tilt and twist (hundredths of deg) v image:A:1,7,8:
 :ROFF and TOFF (mm) v image:A:1,9,10:
 :Positional error (mm) and weighted error v image:A:1,11,12:
 :I/sig(I) overall and outer v image:N:1,18,19:
 :Rsym v image:N:1,20:  
 :SDratio v image:N:1,22:  
 :Number of overloads and badspots v image:A:1,15,17: $$
 IMAGE   CCX   CCY   CCOM  DIST YSCAL TILT TWIST ROFF  TOFF RESID  WRESID  FULL  PART OVRL  NEG BAD I/sigI I/sgI_out Rsym Nsym SDRAT $$ $$
 $$
  $TABLE: Post refinement:
 $GRAPHS :Missets phix phiy phiz v image:A:1,2,3,4:  
 :Cell parameters A,B,C v image:A:1,5,6,7:  
 :Cell angles alpha beta gamma v image:A:1,8,9,10:  
 :Mosaic spread v image:A:1,11:  
 :Beam divergences v image:A:1,12,13: $$  
 Image     PHIX     PHIY     PHIZ        A        B        C      ALPHA     BETA    GAMMA   MOSAIC   DIVH   DIVV    Resid      NR $$ $$
 $$
