----- file created by makedoc on: Tue May 29 14:43:56 2012

----- Documentation for /sware/exp/xop-2.3/extensions/shadowvui/src/vui/xsh_abrefc.pro -----

 =================================  XSh_AbRefC =============================

   XSh_AbRefC is a widget based graphical interface to calculate
   several properties of a given material (over a specified photon
   energy range) that are important for physical optics calculations.
   It interfaces the program ABREFC, part of the ray-tracing package SHADOW.
   It creates intermediate files that are deleted when QUITing XSh_AbRefC.

   The main window contains four buttons:

       QUIT: to exit from the program

       SET PARAMETERS: to define the parameters for the calculation
		THICKNESS: thickness of the material in microns
			(needed for computing the transmission).
		DENSITY: Material density
		INCIDENCE ANGLE: in degrees (for reflectivity)
		PHOTON ENERGY: in eV, start end and step.
		For each element:
			Atomic symbol: Two capitalized letters.
			Formula index.

       SHOW: Display the selected option. Available options are:
		DIELECTRIC FUNCTION: epsilon = 1 - alpha + i* beta
			the user can display alpha or beta. 
			Units are farad/cm
		ABSOPTION COEFFICIENT: Units are cm^(-1)
		TRANSMISSION: Tha transmission through a film of thickness	
			d (as specified by the user):
			T = exp(-d*mu*Phot_ener)
		REFLECTIVITY: The s and p components of the reflectivity
			R are computed from the Fresnel equations and the
			dielectric function. Also available the average
			between the s and p components.
		REFRACTION INDEX: n^2 = epsilon. Only the real part is
			available.
		CROSS SECTION: for photoelectric effect. Units in cm^2
		ELECTRON YIELD: as defined by B. Henke. In essence, the
			primary electron yield is proportional to the
			square of the electric field at the surface of
			the material.
		ENERGY LOSS: The rate at which energetic electrons lose
			energy when travelling through a medium is 
			proportional to the imaginary part of the dielectric
			function. This is obtained directly from the 
			linear medium response theory in the limit of
			small q (Raether, 1960)
			R(Delta_E) = - Imag(1/epsilon)
		F1:	the atomic scattering factor f'
		F2:	the atomic scattering factor f''

       HELP:   Shows this text


 ----------------------------------------------------------------------
       Author: S. Kesmarki, ESRF, Jun 1993
       Modification history:
		9/11/93 M. Sanchez del Rio: add HELP and cosmetics
		16/5/94 M. Sanchez del Rio: adapt to a new version
			   of abrefc (called abrefcnew) which has
			   an extended optical library (> 100 keV) and
			   creates the F1 and F2 files with the atomic
			   scattering factors.
		 94/10/27  M. Sanchez del Rio: cosmetics.
		 94/11/28  MSR avoid the program crashes when try to
			   set #compounds>5 (remarked by N. Brooks)
                95/05/01  Roger J. Dejus, XFD/APS. Added the case
                          'nothing' to the procedure xsh_abrefc_setparam_event to
                          avoid crashing when user enter a <CR>.
                97/10/02  srio@esrf.fr makes use of xop_wd,/default
                97/12/05  srio@esrf.fr adapts for SHADOW-GUI



